A New Six-Step Phase Shifting Technique Using Mixed-Polariscope in Digital Photoelasticity
M. Ramji, K. Ramesh
Abstract
M. Ramji, K. Ramesh
Abstract
Photoelasticity is one of the most widely used techniques for experimental stress and strain analysis. With the availability of low cost digital image processing systems, a separate branch of photoelasticity known as digital photoelasticity came into existence providing whole-field values of the isoclinics (θ) and isochromatics (N) in a true sense. Among the several methods available for data acquisition, phase shifting / polarization stepping techniques are most widely used for their simplicity and accuracy. In this paper a new digital photoelastic method based on phase shifting using monochromatic light source is presented. It provides full field values of θ and N. The arrangement is carefully chosen with the intention of reducing the influence of quarter wave mismatch error in the evaluation of θ and N. The methodology is validated for the benchmark problem of a disk under diametral compression.
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Photoelasticity is one of the most widely used techniques for experimental stress and strain analysis. With the availability of low cost digital image processing systems, a separate branch of photoelasticity known as digital photoelasticity came into existence providing whole-field values of the isoclinics (θ) and isochromatics (N) in a true sense. Among the several methods available for data acquisition, phase shifting / polarization stepping techniques are most widely used for their simplicity and accuracy. In this paper a new digital photoelastic method based on phase shifting using monochromatic light source is presented. It provides full field values of θ and N. The arrangement is carefully chosen with the intention of reducing the influence of quarter wave mismatch error in the evaluation of θ and N. The methodology is validated for the benchmark problem of a disk under diametral compression.
Key concepts: Photoelasticity, Monochromatic color, Computer science, Phase (matter), Polarization (electrochemistry), Benchmark (surveying), Optics, Engineering