Ultra-narrow linewidth measurement based on Voigt profile fitting
Mo Chen, Zhou Meng, Jianfei Wang, Wei Chen
Abstract
Mo Chen, Zhou Meng, Jianfei Wang, Wei Chen
Abstract
We study the method of Voigt profile fitting for ultra-narrow linewidth measurement. It filters out the effect of the spectrum broadening due to the 1/f frequency noise and extracts out the Lorentzian lineshape from the measured spectrum. The resolution is thus greatly promoted than the direct measurement from the self-heterodyne technique. We apply this method to an ultra-narrow-linewidth (~40 Hz by heterodyne beat technique) Brillouin/erbium fiber laser. The linewidth estimated from Voigt fitting method is indicated to be more accurate. In contrast, the linewidths estimated direct from the 3-dB and the 20-dB heterodyne-spectrum width are far over the true linewidth of the BEFL. The Voigt fitting method provides an efficient tool for ultra-narrow-linewidth measurement. And compared with heterodyne beat technique, it is applicable for all types of lasers.
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We study the method of Voigt profile fitting for ultra-narrow linewidth measurement. It filters out the effect of the spectrum broadening due to the 1/f frequency noise and extracts out the Lorentzian lineshape from the measured spectrum. The resolution is thus greatly promoted than the direct measurement from the self-heterodyne technique. We apply this method to an ultra-narrow-linewidth (~40 Hz by heterodyne beat technique) Brillouin/erbium fiber laser. The linewidth estimated from Voigt fitting method is indicated to be more accurate. In contrast, the linewidths estimated direct from the 3-dB and the 20-dB heterodyne-spectrum width are far over the true linewidth of the BEFL. The Voigt fitting method provides an efficient tool for ultra-narrow-linewidth measurement. And compared with heterodyne beat technique, it is applicable for all types of lasers.
Key concepts: Laser linewidth, Voigt profile, Optics, Heterodyne detection, Heterodyne (poetry), Beat (acoustics), Laser, Materials science