ScholarLens Back to search
2012•Applied Physics LettersRequires access

Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method

Qian Li, Yun Liu, Danyang Wang, Ray Leslie Withers, Zhenrong Li, Haosu Luo, Zhuo Xu

Open publisher page 16 citations

Abstract

We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

About this research paper

What this paper is about

We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

Why it matters

OpenAlex reports 16 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single crystal and a BiFeO3 thin film were investigated using both methods. We briefly discuss the observed surface charging phenomena and their influence on the associated piezoresponse hysteresis loops.

Key concepts: Kelvin probe force microscope, Piezoresponse force microscopy, Microscopy, Scanning probe microscopy, Non-contact atomic force microscopy, Ferroelectricity, Atomic force acoustic microscopy, Materials science

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method — Research Paper | ScholarLens