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2007•Physica B Condensed MatterRequires access

Site-specific specimen preparation for atom probe tomography of grain boundaries

Julie M. Cairney, David W. Saxey, D. McGrouther, Simon P. Ringer

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Key concepts: Atom probe, Focused ion beam, Materials science, Grain boundary, Fabrication, Ion beam, Scanning electron microscope, Beam (structure)

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