2006•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Effects of optical back reflection on long wavelength VCSELs

Michael Steib, Yu. V. Vandyshev, R.H. Johnson, Gerhard Franz, Hongyu Deng

Abstract

Understanding of the noise characteristics of a long wavelength (LW) vertical cavity surface-emitting laser (VCSEL) under optical back reflection is crucial for its applications in optical fiber data communication. VCSELs at near 1.31μm are tested and the relative intensity noise (RIN) is measured in the presence of different levels of optical reflection intensity. Innovative LW VCSEL packaging solutions are demonstrated to achieve robust low cost error-free data communication systems.

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Key concepts: Reflection (computer programming), Optoelectronics, Optics, Wavelength, Materials science, Light reflection, Vertical-cavity surface-emitting laser, Laser