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2009•Microscopy and MicroanalysisOpen access

Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

Sandra Van Aert, Johan Verbeeck, Sara Bals, Rolf Erni, D. Van Dyck, S Van Tendeloo

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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What this paper is about

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Key concepts: Dark field microscopy, Scanning confocal electron microscopy, Scanning transmission electron microscopy, Transmission electron microscopy, Materials science, Microanalysis, Optics, Resolution (logic)

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