1993Microscopy Research and TechniqueRequires access

Using ESEM and SEM to compare the performance of dentin conditioners

Lynn C. Gilbert, Robert Doherty

Open publisher page 12 citations

Abstract

A comparison of four dentinal conditioners was performed utilizing a traditional scanning electron microscope (SEM) and a new technology, the ElectroScan environmental scanning electron microscope (ESEM). Both ESEM and SEM analysis verified current theorized mechanisms of adhesion to dentin surfaces. ESEM images appeared to more closely approximate what one would expect cut and treated dentin surfaces look like. Increases in information from the "surfaces" of uncoated specimens and the reduction in specimen preparation time were associated with ESEM analysis.

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What this paper is about

A comparison of four dentinal conditioners was performed utilizing a traditional scanning electron microscope (SEM) and a new technology, the ElectroScan environmental scanning electron microscope (ESEM). Both ESEM and SEM analysis verified current theorized mechanisms of adhesion to dentin surfaces. ESEM images appeared to more closely approximate what one would expect cut and treated dentin surfaces look like. Increases in information from the "surfaces" of uncoated specimens and the reduction in specimen preparation time were associated with ESEM analysis.

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Available abstract

A comparison of four dentinal conditioners was performed utilizing a traditional scanning electron microscope (SEM) and a new technology, the ElectroScan environmental scanning electron microscope (ESEM). Both ESEM and SEM analysis verified current theorized mechanisms of adhesion to dentin surfaces. ESEM images appeared to more closely approximate what one would expect cut and treated dentin surfaces look like. Increases in information from the "surfaces" of uncoated specimens and the reduction in specimen preparation time were associated with ESEM analysis.

Key concepts: Environmental scanning electron microscope, Dentin, Conditioners, Conditioning, Materials science, Composite material, Scanning electron microscope, Mathematics

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