2011Unpublished venueRequires access

Reconfigurable fault-tolerant multielectrode array for dependable monitoring of the human brain

Ipsita Acharya, Bharat Joshi, B. Lanning, Hitten P. Zaveri

Open publisher page 1 citations

Abstract

We introduce a fault-tolerant strategy to improve the dependability of a multi-electrode array (MEA), an issue of considerable concern. We propose an interstitial redundancy approach with local reconfiguration. Here spare modules are placed at interstitial sites and can replace neighboring primary modules when they develop faults. We evaluate the performance of such a system under different faults to characterize MEA dependability as a function of redundancy. The results demonstrate that a considerable improvement in MEA dependability can be achieved with a well designed increase in redundancy.

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What this paper is about

We introduce a fault-tolerant strategy to improve the dependability of a multi-electrode array (MEA), an issue of considerable concern. We propose an interstitial redundancy approach with local reconfiguration. Here spare modules are placed at interstitial sites and can replace neighboring primary modules when they develop faults. We evaluate the performance of such a system under different faults to characterize MEA dependability as a function of redundancy. The results demonstrate that a considerable improvement in MEA dependability can be achieved with a well designed increase in redundancy.

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Available abstract

We introduce a fault-tolerant strategy to improve the dependability of a multi-electrode array (MEA), an issue of considerable concern. We propose an interstitial redundancy approach with local reconfiguration. Here spare modules are placed at interstitial sites and can replace neighboring primary modules when they develop faults. We evaluate the performance of such a system under different faults to characterize MEA dependability as a function of redundancy. The results demonstrate that a considerable improvement in MEA dependability can be achieved with a well designed increase in redundancy.

Key concepts: Dependability, Redundancy (engineering), Control reconfiguration, Spare part, Computer science, Fault tolerance, Reliability engineering, Embedded system

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