1972•Journal of Radioanalytical and Nuclear ChemistryRequires access

Analysis of monomolecular layers of solids by the static method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven, E. Loebach

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Key concepts: Static secondary-ion mass spectrometry, Secondary ion mass spectrometry, Secondary Ion Mass Spectroscopy, Ion, Monolayer, Mass spectrometry, Analytical Chemistry (journal), Spectroscopy

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Analysis of monomolecular layers of solids by the static method of secondary ion mass spectroscopy (SIMS) — Research Paper | ScholarLens