Demonstration of Emittance Compensation through the Measurement of the Slice Emittance of a 10-ps Electron Bunch
X.Z. Qiu, K. Batchelor, I. Ben‐Zvi, Xijie Wang
Abstract
X.Z. Qiu, K. Batchelor, I. Ben‐Zvi, Xijie Wang
Abstract
The beam matrix of a picosecond long slice of an electron bunch was measured. A short slice is selected out of an energy chirped beam by a slit in a dispersive region. The emittance is measured using the quadrupole scan technique. We observe the process of emittance compensation of the beam by repeating the measurement for various values of the compensating solenoid and for several slices.
OpenAlex reports 79 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The beam matrix of a picosecond long slice of an electron bunch was measured. A short slice is selected out of an energy chirped beam by a slit in a dispersive region. The emittance is measured using the quadrupole scan technique. We observe the process of emittance compensation of the beam by repeating the measurement for various values of the compensating solenoid and for several slices.
Key concepts: Thermal emittance, Picosecond, Optics, Beam emittance, Cathode ray, Beam (structure), Electron, Physics