1997Journal of The Electrochemical SocietyOpen access

Oxidation of Hydrogen on Ni/Yttria‐Stabilized Zirconia Cermet Anodes

S. Primdahl, Mogens Bjerg Mogensen

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Abstract

The oxidation of hydrogen on Ni/yttria‐stabilized zirconia (Ni/YSZ) is studied by impedance spectroscopy. The active thickness obtained is 20 μm or less. Conditions such as temperature, anodic overvoltage, electrode potential, and partial pressure are varied. Three distinct arcs are identified in impedance spectra, representing at least three rate‐limiting processes. One equivalent circuit of the type LR ( RQ )( RQ )( RQ ), where , is used to describe all recorded impedance in the temperature range 850 to 1000°C. The n ‐values are held constant, allowing a direct comparison of R and Y 0 values for different structures and conditions. The high‐frequency arc (1 to 50 kHz) is sensitive to the cermet structure (particle size) and relatively insensitive to atmospheric composition and overvoltage. The related imperfect capacitance is suggested to be interpreted as a double‐layer capacitance in the Ni/YSZ interface. The medium‐ (10 Hz to 1 kHz) and low‐frequency arc (0.1 to 10 Hz) are sensitive to atmospheric composition and overvoltage. Both reaction resistances change their dependency on partial pressure around 0.5 atm. The perfect capacitance related to the low‐frequency arc is in the order of 0.5 to 2.5 F/cm 2 , indicating an absorbed charged species rather than surface adsorption.

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The oxidation of hydrogen on Ni/yttria‐stabilized zirconia (Ni/YSZ) is studied by impedance spectroscopy. The active thickness obtained is 20 μm or less. Conditions such as temperature, anodic overvoltage, electrode potential, and partial pressure are varied. Three distinct arcs are identified in impedance spectra, representing at least three rate‐limiting processes. One equivalent circuit of the type LR ( RQ )( RQ )( RQ ), where , is used to describe all recorded impedance in the temperature range 850 to 1000°C. The n ‐values are held constant, allowing a direct comparison of R and Y 0 values for different structures and conditions. The high‐frequency arc (1 to 50 kHz) is sensitive to the cermet structure (particle size) and relatively insensitive to atmospheric composition and overvoltage. The related imperfect capacitance is suggested to be interpreted as a double‐layer capacitance in the Ni/YSZ interface. The medium‐ (10 Hz to 1 kHz) and low‐frequency arc (0.1 to 10 Hz) are sensitive to atmospheric composition and overvoltage. Both reaction resistances change their dependency on partial pressure around 0.5 atm. The perfect capacitance related to the low‐frequency arc is in the order of 0.5 to 2.5 F/cm 2 , indicating an absorbed charged species rather than surface adsorption.

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Available abstract

The oxidation of hydrogen on Ni/yttria‐stabilized zirconia (Ni/YSZ) is studied by impedance spectroscopy. The active thickness obtained is 20 μm or less. Conditions such as temperature, anodic overvoltage, electrode potential, and partial pressure are varied. Three distinct arcs are identified in impedance spectra, representing at least three rate‐limiting processes. One equivalent circuit of the type LR ( RQ )( RQ )( RQ ), where , is used to describe all recorded impedance in the temperature range 850 to 1000°C. The n ‐values are held constant, allowing a direct comparison of R and Y 0 values for different structures and conditions. The high‐frequency arc (1 to 50 kHz) is sensitive to the cermet structure (particle size) and relatively insensitive to atmospheric composition and overvoltage. The related imperfect capacitance is suggested to be interpreted as a double‐layer capacitance in the Ni/YSZ interface. The medium‐ (10 Hz to 1 kHz) and low‐frequency arc (0.1 to 10 Hz) are sensitive to atmospheric composition and overvoltage. Both reaction resistances change their dependency on partial pressure around 0.5 atm. The perfect capacitance related to the low‐frequency arc is in the order of 0.5 to 2.5 F/cm 2 , indicating an absorbed charged species rather than surface adsorption.

Key concepts: Cermet, Yttria-stabilized zirconia, Analytical Chemistry (journal), Materials science, Anode, Capacitance, Dielectric spectroscopy, Overvoltage

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