2011•Applied Physics ARequires access

Crack tip dislocation emission and nanoscale deformation fields in silicon

Chunwang Zhao, Yihao Xing, P. C. Bai, J. J. Li, Yajing Liu, Y. G. Du, M. H. Liu

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Key concepts: Dislocation, Materials science, Peierls stress, Deformation (meteorology), Stress field, Condensed matter physics, Transmission electron microscopy, Dislocation creep

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Crack tip dislocation emission and nanoscale deformation fields in silicon — Research Paper | ScholarLens