2011AIP conference proceedingsOpen access

Condenser Optics in the X-ray Microscope

H. S. Youn, Gung-Chian Yin, Joy C. Andrews, P. Pianetta, Ian McNulty, Catherine Eyberger, Barry Lai

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Abstract

Condenser optics focuses x‐rays on a sample position and has a major effect on the exposure time as well as the contrast of a full‐field x‐ray microscope. We have compared two kinds of condenser optics: a capillary and a zone plate by taking images of the same sample at three different x‐ray microscopes.

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Condenser optics focuses x‐rays on a sample position and has a major effect on the exposure time as well as the contrast of a full‐field x‐ray microscope. We have compared two kinds of condenser optics: a capillary and a zone plate by taking images of the same sample at three different x‐ray microscopes.

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Available abstract

Condenser optics focuses x‐rays on a sample position and has a major effect on the exposure time as well as the contrast of a full‐field x‐ray microscope. We have compared two kinds of condenser optics: a capillary and a zone plate by taking images of the same sample at three different x‐ray microscopes.

Key concepts: Condenser (optics), Microscope, Optics, Computer science, Materials science, Computer graphics (images), Physics, Light source

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