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2010•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Effect of junction temperature on the performance of high-power white LEDs

Jijun Li, Lihua Zhang, Anxiang Wang, Chunwang Zhao, Lin Lin

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Abstract

Junction temperature is a critically important parameter for high-power white LED applications. It has directly influence upon light output, device life time, reliability, and emitting wavelength of an LED. In this paper, the principle and common types of LED is introduced. The effects of the junction temperature on performance of high-power LED are discussed. The influencing factors of the junction temperature are analyzed, and some general guidelines to maintain a low junction temperature to keep good performance of an LED are given.

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What this paper is about

Junction temperature is a critically important parameter for high-power white LED applications. It has directly influence upon light output, device life time, reliability, and emitting wavelength of an LED. In this paper, the principle and common types of LED is introduced. The effects of the junction temperature on performance of high-power LED are discussed. The influencing factors of the junction temperature are analyzed, and some general guidelines to maintain a low junction temperature to keep good performance of an LED are given.

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Available abstract

Junction temperature is a critically important parameter for high-power white LED applications. It has directly influence upon light output, device life time, reliability, and emitting wavelength of an LED. In this paper, the principle and common types of LED is introduced. The effects of the junction temperature on performance of high-power LED are discussed. The influencing factors of the junction temperature are analyzed, and some general guidelines to maintain a low junction temperature to keep good performance of an LED are given.

Key concepts: Junction temperature, Thermal management of high-power LEDs, Light-emitting diode, Materials science, Optoelectronics, Reliability (semiconductor), Power (physics), Temperature measurement

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