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2007•Electrochimica ActaRequires access

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Michael Rohwerder, Florin Turcu

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Key concepts: Kelvin probe force microscope, Volta potential, Scanning probe microscopy, Microscopy, Chemistry, Nanotechnology, Analytical Chemistry (journal), Atomic force microscopy

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High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP) — Research Paper | ScholarLens