Calculation Methods to Determine Crystallographic Elements Based on Electron Diffraction Orientation Measurements by SEM/EBSD or TEM

In the present work, we summarized two calculation methods to determine some specific crystallographic elements based on electron diffraction orientation measurements by SEM/EBSD or TEM. The first one is to determine the twin type and twinning elements of crystal twins based on the minimum shear criterion, using the experimentally determined twinning plane for Type I twin and compound twin or twinning direction for Type II twin as initial input. The method is valid for any crystal structure. The second one is one to determine the plane indices of the faceted interfaces where the orientation relationships (ORs) between the adjacent crystals are reproducible. The method requires one prepared sample surface instead of two perpendicular surfaces. These methods are expected to facilitate the related microstructural characterizations.