1979•Journal of Physics C Solid State PhysicsOpen access

The M4,5N4,5N4,5Auger spectra of Ag, Cd, In and Sn

A C Parry-Jones, P. Weightman, P T Andrews

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Abstract

High-resolution M4,5N4,5N4,5Auger and M5and valence-band photoelectron spectra of Ag, Cd, In and Sn, measured using X-ray excitation, are combined to yield the magnitude of Ueff, the Coulomb repulsion between two holes on the same atomic site. The extra-atomic relaxation contributions to Auger and photoelectron processes in these elements are determined by comparing the experimental results with atomic structure calculations. The relationship Ueff>>2W, where W is the width of the 4d band, holds for Cd, In and Sn and the M4,5N4,5N4,5Auger spectra of these elements are in good agreement with multiplet structure calculations. Discrepancies between the observed and the calculated M4,5N4,5N4,5spectra of Ag are interpreted in terms of its failure to satisfy the Ueff>>2W condition and the variation of Ueffwith the final-state component of the Auger spectrum. It is suggested that the3F4component is able to decay into the Ag 4d band and is thus substantially broader than the other components of the Auger spectrum.

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High-resolution M4,5N4,5N4,5Auger and M5and valence-band photoelectron spectra of Ag, Cd, In and Sn, measured using X-ray excitation, are combined to yield the magnitude of Ueff, the Coulomb repulsion between two holes on the same atomic site. The extra-atomic relaxation contributions to Auger and photoelectron processes in these elements are determined by comparing the experimental results with atomic structure calculations. The relationship Ueff>>2W, where W is the width of the 4d band, holds for Cd, In and Sn and the M4,5N4,5N4,5Auger spectra of these elements are in good agreement with multiplet structure calculations. Discrepancies between the observed and the calculated M4,5N4,5N4,5spectra of Ag are interpreted in terms of its failure to satisfy the Ueff>>2W condition and the variation of Ueffwith the final-state component of the Auger spectrum. It is suggested that the3F4component is able to decay into the Ag 4d band and is thus substantially broader than the other components of the Auger spectrum.

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Available abstract

High-resolution M4,5N4,5N4,5Auger and M5and valence-band photoelectron spectra of Ag, Cd, In and Sn, measured using X-ray excitation, are combined to yield the magnitude of Ueff, the Coulomb repulsion between two holes on the same atomic site. The extra-atomic relaxation contributions to Auger and photoelectron processes in these elements are determined by comparing the experimental results with atomic structure calculations. The relationship Ueff>>2W, where W is the width of the 4d band, holds for Cd, In and Sn and the M4,5N4,5N4,5Auger spectra of these elements are in good agreement with multiplet structure calculations. Discrepancies between the observed and the calculated M4,5N4,5N4,5spectra of Ag are interpreted in terms of its failure to satisfy the Ueff>>2W condition and the variation of Ueffwith the final-state component of the Auger spectrum. It is suggested that the3F4component is able to decay into the Ag 4d band and is thus substantially broader than the other components of the Auger spectrum.

Key concepts: Auger, Spectral line, Atomic physics, Multiplet, Chemistry, Valence band, Auger effect, Auger electron spectroscopy

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