Investigation into the field and frequency dependences of the dielectric parameters of α-As2Se3 amorphous films

This paper reports on the results of an investigation into the field and frequency dependences of dielectric parameters (such as the permittivity ɛ and the dielectric loss tangent tanδ) for α-As 2 Se 3 amorphous films. It is found that, as the electric field strength increases, the permittivity ɛ decreases and the maximum of the dielectric loss tangent tanδ shifts toward lower frequencies.