1982Zeitschrift für Naturforschung AOpen access

\Iultistereo Synchrotron X-ray Topography

T. Tuomi, Väinö Kelhä, K. Naukkarinen, M. Blomberg

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Abstract

Abstract Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

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Abstract Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

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Available abstract

Abstract Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.

Key concepts: Reflection (computer programming), Synchrotron radiation, Synchrotron, X-ray, Optics, Silicon, Crystal (programming language), Transmission (telecommunications)

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