\Iultistereo Synchrotron X-ray Topography
T. Tuomi, Väinö Kelhä, K. Naukkarinen, M. Blomberg
Abstract
T. Tuomi, Väinö Kelhä, K. Naukkarinen, M. Blomberg
Abstract
Abstract Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.
OpenAlex reports 5 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Abstract Any two of several reflection or transmission x-ray topographs taken simultaneously with polychromatic synchrotron radiation form a stereo pair. Multistereoscopic transmission and reflection patterns of topographs taken from a silicon and iron-silicon crystal are presented. The directions and depths of defects are calculated from the measurements on the images in two symmetric topographs.
Key concepts: Reflection (computer programming), Synchrotron radiation, Synchrotron, X-ray, Optics, Silicon, Crystal (programming language), Transmission (telecommunications)