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1967•Journal of Scientific InstrumentsOpen access

A method for indexing field ion micrographs

Robert W. Newman, R. C. Sanwald, John J. Hren

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Abstract

A method is presented for indexing field ion micrographs employing only a linear measurement on the micrograph. The resulting projection (pseudo-stereographic) is shown to be equivalent to the one proposed by Brandon, over the angular range of a field ion micrograph, while being much simpler to apply to experimental data.

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A method is presented for indexing field ion micrographs employing only a linear measurement on the micrograph. The resulting projection (pseudo-stereographic) is shown to be equivalent to the one proposed by Brandon, over the angular range of a field ion micrograph, while being much simpler to apply to experimental data.

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Available abstract

A method is presented for indexing field ion micrographs employing only a linear measurement on the micrograph. The resulting projection (pseudo-stereographic) is shown to be equivalent to the one proposed by Brandon, over the angular range of a field ion micrograph, while being much simpler to apply to experimental data.

Key concepts: Micrograph, Stereographic projection, Electron micrographs, Field (mathematics), Projection (relational algebra), Ion, Optics, Range (aeronautics)

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