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2015•Applied OpticsRequires access

Instrument transfer function of slope measuring deflectometry systems

Tianquan Su, Alejandro Maldonado, P. P. Su, James H. Burge

Open publisher page 19 citations

Abstract

Slope measuring deflectometry (SMD) systems are developing rapidly in testing freeform optics. They measure the surface slope using a camera and an incoherent source. The principle of the test is mainly discussed in geometric optic domain. The system response as a function of spatial frequency or instrument transfer function (ITF) has yet to be studied thoroughly. Through mathematical modeling, simulation, and experiment we show that the ITF of an SMD system is very close to the modulation transfer function of the camera used. Furthermore, the ITF can be enhanced using a deconvolution filter. This study will lead to more accurate measurements in SMD and will show the physical optics nature of these tests.

About this research paper

What this paper is about

Slope measuring deflectometry (SMD) systems are developing rapidly in testing freeform optics. They measure the surface slope using a camera and an incoherent source. The principle of the test is mainly discussed in geometric optic domain. The system response as a function of spatial frequency or instrument transfer function (ITF) has yet to be studied thoroughly. Through mathematical modeling, simulation, and experiment we show that the ITF of an SMD system is very close to the modulation transfer function of the camera used. Furthermore, the ITF can be enhanced using a deconvolution filter. This study will lead to more accurate measurements in SMD and will show the physical optics nature of these tests.

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OpenAlex reports 19 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Slope measuring deflectometry (SMD) systems are developing rapidly in testing freeform optics. They measure the surface slope using a camera and an incoherent source. The principle of the test is mainly discussed in geometric optic domain. The system response as a function of spatial frequency or instrument transfer function (ITF) has yet to be studied thoroughly. Through mathematical modeling, simulation, and experiment we show that the ITF of an SMD system is very close to the modulation transfer function of the camera used. Furthermore, the ITF can be enhanced using a deconvolution filter. This study will lead to more accurate measurements in SMD and will show the physical optics nature of these tests.

Key concepts: Optical transfer function, Optics, Transfer function, Deconvolution, Spatial frequency, Point spread function, Geometrical optics, Physical optics

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