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Off resonance ac mode force spectroscopy and imaging with an atomic force microscope

Suzanne Jarvis, Mark A. Lantz, U. Dürig, Hiroshi Tokumoto

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Key concepts: Magnetic force microscope, Non-contact atomic force microscopy, Atomic force acoustic microscopy, Cantilever, Magnetic resonance force microscopy, Force spectroscopy, Electrostatic force microscope, Kelvin probe force microscope

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Off resonance ac mode force spectroscopy and imaging with an atomic force microscope — Research Paper | ScholarLens