Ferromagnetic resonance micromagnetic studies in patterned permalloy thin films and stripes
G. R. Aranda, Gleb N. Kakazei, J. González, K. Y. Guslienko
Abstract
G. R. Aranda, Gleb N. Kakazei, J. González, K. Y. Guslienko
Abstract
We present micromagnetic simulations of ferromagnetic resonance in patterned permalloy films and isolated stripes. Films of the total thickness 20 nm or 40 nm are patterned in the form of 1D periodic structures with rectangular profile (rectangular grooves of depth varying from zero up to the film thickness) and in-plane period of 500 nm. The direction of the applied dc magnetic field is varied in the film plane from the direction parallel to the stripes to perpendicular one. The thickness of the patterned elements and direction of the bias field affect essentially the resonance peaks (changing their position, amplitude and number) and the corresponding dynamical magnetization profiles. We simulated from one up to three ferromagnetic resonance peaks and found the areas of microwave magnetization localization for them.
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We present micromagnetic simulations of ferromagnetic resonance in patterned permalloy films and isolated stripes. Films of the total thickness 20 nm or 40 nm are patterned in the form of 1D periodic structures with rectangular profile (rectangular grooves of depth varying from zero up to the film thickness) and in-plane period of 500 nm. The direction of the applied dc magnetic field is varied in the film plane from the direction parallel to the stripes to perpendicular one. The thickness of the patterned elements and direction of the bias field affect essentially the resonance peaks (changing their position, amplitude and number) and the corresponding dynamical magnetization profiles. We simulated from one up to three ferromagnetic resonance peaks and found the areas of microwave magnetization localization for them.
Key concepts: Permalloy, Ferromagnetic resonance, Condensed matter physics, Magnetization, Materials science, Film plane, Perpendicular, Ferromagnetism