2003•Applied OpticsRequires access

Diffraction and line shape of Fourier-transform spectrometers

Jérôme Genest, Pierre Tremblay

Abstract

The effect of diffraction the instrument line shape of a Fourier-transform spectrometer is studied with an analytical line-shape model. The expression for the instrument line shape of a diffracted point source is obtained. A simple condition on the throughput of the instrument is derived under which diffraction is negligible when compared with the field-of-view-induced line shape. The effect of diffraction is illustrated and compared for various instruments.

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Key concepts: Optics, Diffraction, Fourier transform, Spectrometer, Line (geometry), Ptychography, Fourier optics, Fresnel diffraction