2007•Applied Physics LettersOpen access

Ti-rich and Cu-poor grain-boundary layers of CaCu3Ti4O12 detected by x-ray photoelectron spectroscopy

Chuan Bao Wang, H. J. Zhang, Ping He, Guang‐Han Cao

Abstract

Cleaved and polished surfaces of CaCu3Ti4O12 ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu3Ti4O12 stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2p unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.

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Key concepts: X-ray photoelectron spectroscopy, Grain boundary, Copper, Materials science, Stoichiometry, X-ray spectroscopy, Spectroscopy, Analytical Chemistry (journal)