Ryan Z. Swan, A. K. Ray, C. A. Hogarth, Debashis Mukherjee
Abstract
In situ DC measurements made on 50nm-thick tellurium films sandwiched between copper electrodes show an existence of ohmic contacts at the metal/semiconductor interface. Conduction in the polycrystalline film at higher fields is believed to be due to space-charge-limited current flow.
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In situ DC measurements made on 50nm-thick tellurium films sandwiched between copper electrodes show an existence of ohmic contacts at the metal/semiconductor interface. Conduction in the polycrystalline film at higher fields is believed to be due to space-charge-limited current flow.
Key concepts: Tellurium, Ohmic contact, Materials science, Semiconductor, Copper, Space charge, Optoelectronics, Metal