Simple high resolution nanoimprint-lithography
Michael Haffner, A. Heeren, Monika Fleischer, D. P. Kern, G. Schmidt, L. W. Molenkamp
Abstract
Michael Haffner, A. Heeren, Monika Fleischer, D. P. Kern, G. Schmidt, L. W. Molenkamp
Abstract
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Key concepts: Nanoimprint lithography, Hydrogen silsesquioxane, Resist, Materials science, Nanotechnology, Electron-beam lithography, Nanolithography, Lithography