2011•Microelectronics ReliabilityRequires access

Functional fault models for non-scan sequential circuits

Eduardas Bareiša, Vacius Jusas, Kęstutis Motiejūnas, Rimantas Šeinauskas

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Key concepts: Fault coverage, Automatic test pattern generation, Fault (geology), Stuck-at fault, Fault model, Test set, Set (abstract data type), State (computer science)

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