Junction Barrier Schottky Diodes in 4H-SiC and 6H-SiC
Fanny Dahlquist, Carl‐Mikael Zetterling, Mikael Östling, K. Rottner
Abstract
Fanny Dahlquist, Carl‐Mikael Zetterling, Mikael Östling, K. Rottner
Abstract
The Junction Barrier Schottky (JBS) diode in silicon carbide is a promising candidate for a low-leakage power rectifier for high switching frequencies and elevated temperature operation. It has the advantage of a low forward voltage drop while keeping a low leakage current at high blocking voltage. JBS devices have been fabricated in 4H SiC and 6H SiC and then electrically characterised in comparison with pn and Schottky diodes on the same wafer. The JBS devices reached blocking voltages up to 1.0 kV at a leakage current density of 13 IŒA/cm2 and the forward conduction was limited by an on-resistance close to the theoretical value.
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The Junction Barrier Schottky (JBS) diode in silicon carbide is a promising candidate for a low-leakage power rectifier for high switching frequencies and elevated temperature operation. It has the advantage of a low forward voltage drop while keeping a low leakage current at high blocking voltage. JBS devices have been fabricated in 4H SiC and 6H SiC and then electrically characterised in comparison with pn and Schottky diodes on the same wafer. The JBS devices reached blocking voltages up to 1.0 kV at a leakage current density of 13 IŒA/cm2 and the forward conduction was limited by an on-resistance close to the theoretical value.
Key concepts: Materials science, Schottky diode, Optoelectronics, Silicon carbide, Schottky barrier, Diode, Wafer, Metal–semiconductor junction