1987•Applied Physics LettersRequires access
Study of dynamic current distribution in logic circuits by Joule displacement microscopy
Y. Martin, H. K. Wickramasinghe
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Abstract
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.