2014•UltramicroscopyRequires access

Determining the thickness of atomically thin MoS2 and WS2 in the TEM

Ryan J. Wu, Michael L. Odlyzko, K. Andre Mkhoyan

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Key concepts: Selected area diffraction, Monolayer, Tilt (camera), Scanning transmission electron microscopy, Transmission electron microscopy, Dark field microscopy, Zone axis, Diffraction