Genetic analysis of partial resistance to basal stem rot (Sclerotinia sclerotiorum) in sunflower

Basal stem rot, caused by Sclerotinia sclerotiorum (Lib.) de Bary, is one of the major diseases of sunflower (Helianthus annuus L.) in the world. Quantitative trait loci (QTLs) implicated in partial resistance to basal stem rot disease were identified using 99 recombinant inbred lines (RILs) from the cross between sunflower parental lines PAC2 and RHA266. The study was undertaken in a completely randomized design with three replications under controlled conditions. The RILs and their parental lines were inoculated with a moderately aggressive isolate of S. sclerotiorum (SSKH41). Resistance to disease was evaluated by measuring the percentage of necrosis area three days after inoculation. QTLs were mapped using an updated high-density SSR and SNP linkage map. ANOVA showed significant differences among sunflower lines for resistance to basal stem rot (P?0.05). The frequency distribution of lines for susceptibility to disease showed a continuous pattern. Composite interval mapping analysis revealed 5 QTLs for percentage of necrotic area, localized on linkage groups 1, 3, 8, 10 and 17. The sign of additive effect was positive in 5 QTLs, suggesting that the additive allele for partial resistance to basal stem rot came from the paternal line (RHA266). The phenotypic variance explained by QTLs (R2) ranged from 0.5 to 3.16%. Identified genes (HUCL02246_1, GST and POD), and SSR markers (ORS338, and SSL3) encompassing the QTLs for partial resistance to basal stem rot could be good candidates for marker assisted selection.