Study of metal surfaces by scanning tunneling microscopy with field ion microscopy
Y. Kuk, P. J. Silvėrman, Hung Quang Nguyen
Abstract
Y. Kuk, P. J. Silvėrman, Hung Quang Nguyen
Abstract
The reconstruction of Au and Ni surfaces has been studied by scanning tunneling microscopy (STM). The correlation between the tunneling tip geometry, observed by field ion microscopy, and the resultant STM image leads to an operational definition of STM resolution. New structural models for Ni(110)–H and Ni(110)–Au surfaces are proposed.
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The reconstruction of Au and Ni surfaces has been studied by scanning tunneling microscopy (STM). The correlation between the tunneling tip geometry, observed by field ion microscopy, and the resultant STM image leads to an operational definition of STM resolution. New structural models for Ni(110)–H and Ni(110)–Au surfaces are proposed.
Key concepts: Scanning tunneling microscope, Field ion microscope, Microscopy, Scanning ion-conductance microscopy, Materials science, Spin polarized scanning tunneling microscopy, Quantum tunnelling, Scanning probe microscopy