2008•CATENAOpen access

Accounting for shape reliability in modeling contour-derived topographic properties for use in soil–terrain correlation

Anicet Sindayihebura, Marc Van Meirvenne, Simon Verstraete, Stanislas Nsabimana

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Key concepts: Terrain, Geology, Reliability (semiconductor), Soil science, Geomorphology, Cartography, Geography, Quantum mechanics

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Accounting for shape reliability in modeling contour-derived topographic properties for use in soil–terrain correlation — Research Paper | ScholarLens