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2001•Applied Physics LettersRequires access

Refraction contrast imaging with a scanning microlens

Daniel A. Fletcher, Kenneth B. Crozier, C. F. Quate, G. S. Kino, Kenneth E. Goodson, D. Simanovskii, Daniel Palanker

Open publisher page 12 citations

Abstract

We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 μm in diameter, we measure spatial resolution due to refraction contrast of λ/4.3 at a wavelength of λ=10.7 μm. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles.

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What this paper is about

We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 μm in diameter, we measure spatial resolution due to refraction contrast of λ/4.3 at a wavelength of λ=10.7 μm. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles.

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Available abstract

We demonstrate subwavelength spatial resolution with a scanning microlens operating in collection mode with a large-area detector. Optical contrast is created by refraction of off-axis light rays at angles larger than the maximum collection angle. With a microfabricated silicon microlens 10 μm in diameter, we measure spatial resolution due to refraction contrast of λ/4.3 at a wavelength of λ=10.7 μm. A model based on ray tracing is developed to explain our result, and we show that lens diameter and index of refraction limit resolution for large emission and collection angles.

Key concepts: Optics, Microlens, Refraction, Image resolution, Phase-contrast imaging, Wavelength, Resolution (logic), Refractive index

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