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2014•Journal of InstrumentationOpen access

A multichannel time-to-digital converter ASIC with better than 3 ps RMS time resolution

Lukas Perktold, J. Christiansen

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Abstract

The development of a new multichannel, fine-time resolution time-to-digital converter (TDC) ASIC is currently under development at CERN. A prototype TDC has been designed, fabricated and successfully verified with demonstrated time resolutions of better than 3 ps-rms. Least-significant-bit (LSB) sizes as small as 5 ps with a differential-non-linearity (DNL) of better than ±0.9 LSB and integral-non-linearity (INL) of better than ±1.3 LSB respectively have been achieved. The contribution describes the implemented architecture and presents measurement results of a prototype ASIC implemented in a commercial 130 nm technology.

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What this paper is about

The development of a new multichannel, fine-time resolution time-to-digital converter (TDC) ASIC is currently under development at CERN. A prototype TDC has been designed, fabricated and successfully verified with demonstrated time resolutions of better than 3 ps-rms. Least-significant-bit (LSB) sizes as small as 5 ps with a differential-non-linearity (DNL) of better than ±0.9 LSB and integral-non-linearity (INL) of better than ±1.3 LSB respectively have been achieved. The contribution describes the implemented architecture and presents measurement results of a prototype ASIC implemented in a commercial 130 nm technology.

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Available abstract

The development of a new multichannel, fine-time resolution time-to-digital converter (TDC) ASIC is currently under development at CERN. A prototype TDC has been designed, fabricated and successfully verified with demonstrated time resolutions of better than 3 ps-rms. Least-significant-bit (LSB) sizes as small as 5 ps with a differential-non-linearity (DNL) of better than ±0.9 LSB and integral-non-linearity (INL) of better than ±1.3 LSB respectively have been achieved. The contribution describes the implemented architecture and presents measurement results of a prototype ASIC implemented in a commercial 130 nm technology.

Key concepts: Least significant bit, Differential nonlinearity, Application-specific integrated circuit, Linearity, Time-to-digital converter, Integral nonlinearity, Resolution (logic), Computer science

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