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Scanning Near-field Optical Microscopy in Life Science

Andrea Jauß, Joachim Koenen, Klaus Weishaupt, O. Hollricher

Open publisher page 8 citations

Abstract

Scanning Near-field Optical Microscopy (SNOM) allows optical microscopy with highest spatial resolution beyond the diffraction limit. We present a new microscope set-up which uses micro-machined cantilever SNOM sensors and combines in a unique way the advantages of Scanning Near-field Optical Microscopy, Confocal Scanning Microscopy (CSM) and Atomic Force Microscopy (AFM) in one instrument. Results from measurement at different samples system like histological microtome cuts and fluorescent labelled human chromosomes are shown to demonstrate the capabilities of the new set-up.

About this research paper

What this paper is about

Scanning Near-field Optical Microscopy (SNOM) allows optical microscopy with highest spatial resolution beyond the diffraction limit. We present a new microscope set-up which uses micro-machined cantilever SNOM sensors and combines in a unique way the advantages of Scanning Near-field Optical Microscopy, Confocal Scanning Microscopy (CSM) and Atomic Force Microscopy (AFM) in one instrument. Results from measurement at different samples system like histological microtome cuts and fluorescent labelled human chromosomes are shown to demonstrate the capabilities of the new set-up.

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OpenAlex reports 8 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Scanning Near-field Optical Microscopy (SNOM) allows optical microscopy with highest spatial resolution beyond the diffraction limit. We present a new microscope set-up which uses micro-machined cantilever SNOM sensors and combines in a unique way the advantages of Scanning Near-field Optical Microscopy, Confocal Scanning Microscopy (CSM) and Atomic Force Microscopy (AFM) in one instrument. Results from measurement at different samples system like histological microtome cuts and fluorescent labelled human chromosomes are shown to demonstrate the capabilities of the new set-up.

Key concepts: Near-field scanning optical microscope, Optical microscope, Microscopy, Scanning ion-conductance microscopy, Scanning confocal electron microscopy, Scanning probe microscopy, Optics, Materials science

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