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Holders for in situ treatments of scanning tunneling microscopy tips

Nobuyuki Ishida, Agus Subagyo, Akira Ikeuchi, Kazuhisa Sueoka

Abstract

We have developed holders for scanning tunneling microscopy tips that can be used for in situ treatments of the tips, such as electron bombardment (EB) heating, ion sputtering, and the coating of magnetic materials. The holders can be readily installed into the transfer paths and do not require any special type of base stages. Scanning electron microscopy is used to characterize the tip apex after EB heating. Also, spin-polarized scanning tunneling spectroscopy using an Fe coated W tip on the Cr(001) single crystal surface is performed in order to confirm both the capability of heating a tip up to about 2200 K and the spin sensitivity of the magnetically coated tip.

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Key concepts: Scanning tunneling microscope, Scanning electron microscope, Materials science, Spin polarized scanning tunneling microscopy, Sputtering, Scanning probe microscopy, Electrochemical scanning tunneling microscope, Scanning ion-conductance microscopy