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A method of using the incident beam tilt as a eucentric goniometer in transmission electron microscopy

Olof Vingsbo, Takashi YANAKA, K. Shirota

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Key concepts: Goniometer, Optics, Tilt (camera), Chromatic aberration, Diffraction, Spherical aberration, Aperture (computer memory), Beam (structure)

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A method of using the incident beam tilt as a eucentric goniometer in transmission electron microscopy — Research Paper | ScholarLens