Assembly of Ge nanocrystals on SiO2via a stress-induced dewetting process
Eli A. Sutter, Peter W. Sutter
Abstract
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Eli A. Sutter, Peter W. Sutter
Abstract
Open-access reader
We use epitaxial Ge islands on silicon-on-insulator (001) to initiate and drive the dewetting of the ultrathin (<8 nm) Si template layer. The process exposes the underlying SiO 2 layer and transforms the Ge islands into oxide-supported, electrically isolated, Ge-rich nanocrystals. We investigate the process of dewetting and demonstrate that it can be used for the controlled assembly of nanocrystals—from isolated single ones to dense arrays.
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We use epitaxial Ge islands on silicon-on-insulator (001) to initiate and drive the dewetting of the ultrathin (<8 nm) Si template layer. The process exposes the underlying SiO 2 layer and transforms the Ge islands into oxide-supported, electrically isolated, Ge-rich nanocrystals. We investigate the process of dewetting and demonstrate that it can be used for the controlled assembly of nanocrystals—from isolated single ones to dense arrays.
Key concepts: Dewetting, Materials science, Nanocrystal, Layer (electronics), Epitaxy, Nanotechnology, Silicon, Oxide