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2002•Journal of Analytical Atomic SpectrometryRequires access

Inorganic speciation in static SIMS: a comparative study between monatomic and polyatomic primary ions

Rita Van Ham, Luc Van Vaeck, Annemie Adriaens, F. Adams, Brittany Hodges, Gary S. Groenewold

Open publisher page 18 citations

Abstract

This paper addresses the use of static SIMS (S-SIMS) for the speciation of inorganic compounds. Specifically, the use of SF5+ and ReO4− polyatomic primary ions for the analysis of binary salts is compared to bombardment with Ga+. The features of the mass spectra are discussed with respect to the gain in secondary ion intensity and the increased production of molecule-specific adduct ions and structural fragments when using polyatomic instead of monatomic ion bombardment.

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What this paper is about

This paper addresses the use of static SIMS (S-SIMS) for the speciation of inorganic compounds. Specifically, the use of SF5+ and ReO4− polyatomic primary ions for the analysis of binary salts is compared to bombardment with Ga+. The features of the mass spectra are discussed with respect to the gain in secondary ion intensity and the increased production of molecule-specific adduct ions and structural fragments when using polyatomic instead of monatomic ion bombardment.

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OpenAlex reports 18 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

This paper addresses the use of static SIMS (S-SIMS) for the speciation of inorganic compounds. Specifically, the use of SF5+ and ReO4− polyatomic primary ions for the analysis of binary salts is compared to bombardment with Ga+. The features of the mass spectra are discussed with respect to the gain in secondary ion intensity and the increased production of molecule-specific adduct ions and structural fragments when using polyatomic instead of monatomic ion bombardment.

Key concepts: Monatomic ion, Polyatomic ion, Chemistry, Ion, Primary (astronomy), Molecule, Mass spectrum, Adduct

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