A Study on Reliability for A Two-Item Cold Standby Markov Repairable System with Neglected Failures

This article studies reliability for a Markov repairable two-item cold standby system with neglected failures. In the system, if a failed time of the system is too short (less than a given critical value) to cause the system to fail, then the failed time may be omitted from the downtime record, i.e., the failure effect could be neglected. In ion-channel modeling, this situation is called the time interval omission problem. The availability indices and the mean downtime are presented as two measures of reliability for this repairable system. Some numerical examples are shown to illustrate the results obtained in this article.