1995•Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and AtomsRequires access

Fourier transform-ion cyclotron resonance mass spectrometry — A new tool for measuring highly charged ions in an electron beam ion trap

P. Beiersdörfer, St. Becker, Belinda R. Beck, S. R. Elliott, K. Widmann, L. Schweikhard

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Key concepts: Fourier transform ion cyclotron resonance, Electron beam ion trap, Ion, Ion trap, Ion cyclotron resonance, Mass spectrometry, Ion beam deposition, Atomic physics

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