2001Journal of Applied PhysicsRequires access

Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering

Philippe Djémia, C. Dugautier, Th. Chauveau, El Hadj Dogheche, M.I. De Barros, L. Vandenbulcke

Open publisher page 70 citations

Abstract

Brillouin light scattering, Raman light scattering and x-ray diffraction were used to investigate the elastic and microstructural properties of polycrystalline and smooth fine-grained diamond films of varying diamond quality. They were deposited on a titanium alloy by a two-step microwave plasma-assisted chemical vapor deposition process at 600 °C. Their morphology and roughness were studied by scanning electron microscopy and atomic force microscopy. Their refractive indices were determined by the M-line spectroscopy technique. The diamond purity of all these coatings in terms of the sp3 bonding fraction was deduced from visible and UV Raman spectroscopy as a function of the deposition conditions. All the samples were found to be textured with a 〈011〉 crystallographic direction normal to the film plane, leading to essentially hexagonal symmetry of the elastic tensor. By taking advantage of the detection of a number of different acoustic modes, complete elastic characterization of the films was achieved. The elastic constants C11 and C66, respectively, were selectively determined from the frequency of the longitudinal and shear horizontal bulk modes traveling parallel to the film surface. The three remaining elastic constants, namely, C44, C33 and C13, were obtained from detection of the Rayleigh surface wave a bulk shear wave and the bulk longitudinal wave propagating at different angles from the normal to the surface. The values of the elastic constants depend on the deposition conditions and on the microstructural properties of the films, especially the diamond quality and the polycrystalline or smooth fine-grained nature of the diamond. For the polycrystalline diamond film with the best quality, the elastic constants are rather close to the Voigt or Reuss average estimate values using known bulk elastic constants of diamond, whereas those of the smooth fine-grained diamond films are reduced because of the poorer diamond quality leading to lower residual stress in the films.

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Brillouin light scattering, Raman light scattering and x-ray diffraction were used to investigate the elastic and microstructural properties of polycrystalline and smooth fine-grained diamond films of varying diamond quality. They were deposited on a titanium alloy by a two-step microwave plasma-assisted chemical vapor deposition process at 600 °C. Their morphology and roughness were studied by scanning electron microscopy and atomic force microscopy. Their refractive indices were determined by the M-line spectroscopy technique. The diamond purity of all these coatings in terms of the sp3 bonding fraction was deduced from visible and UV Raman spectroscopy as a function of the deposition conditions. All the samples were found to be textured with a 〈011〉 crystallographic direction normal to the film plane, leading to essentially hexagonal symmetry of the elastic tensor. By taking advantage of the detection of a number of different acoustic modes, complete elastic characterization of the films was achieved. The elastic constants C11 and C66, respectively, were selectively determined from the frequency of the longitudinal and shear horizontal bulk modes traveling parallel to the film surface. The three remaining elastic constants, namely, C44, C33 and C13, were obtained from detection of the Rayleigh surface wave a bulk shear wave and the bulk longitudinal wave propagating at different angles from the normal to the surface. The values of the elastic constants depend on the deposition conditions and on the microstructural properties of the films, especially the diamond quality and the polycrystalline or smooth fine-grained nature of the diamond. For the polycrystalline diamond film with the best quality, the elastic constants are rather close to the Voigt or Reuss average estimate values using known bulk elastic constants of diamond, whereas those of the smooth fine-grained diamond films are reduced because of the poorer diamond quality leading to lower residual stress in the films.

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Available abstract

Brillouin light scattering, Raman light scattering and x-ray diffraction were used to investigate the elastic and microstructural properties of polycrystalline and smooth fine-grained diamond films of varying diamond quality. They were deposited on a titanium alloy by a two-step microwave plasma-assisted chemical vapor deposition process at 600 °C. Their morphology and roughness were studied by scanning electron microscopy and atomic force microscopy. Their refractive indices were determined by the M-line spectroscopy technique. The diamond purity of all these coatings in terms of the sp3 bonding fraction was deduced from visible and UV Raman spectroscopy as a function of the deposition conditions. All the samples were found to be textured with a 〈011〉 crystallographic direction normal to the film plane, leading to essentially hexagonal symmetry of the elastic tensor. By taking advantage of the detection of a number of different acoustic modes, complete elastic characterization of the films was achieved. The elastic constants C11 and C66, respectively, were selectively determined from the frequency of the longitudinal and shear horizontal bulk modes traveling parallel to the film surface. The three remaining elastic constants, namely, C44, C33 and C13, were obtained from detection of the Rayleigh surface wave a bulk shear wave and the bulk longitudinal wave propagating at different angles from the normal to the surface. The values of the elastic constants depend on the deposition conditions and on the microstructural properties of the films, especially the diamond quality and the polycrystalline or smooth fine-grained nature of the diamond. For the polycrystalline diamond film with the best quality, the elastic constants are rather close to the Voigt or Reuss average estimate values using known bulk elastic constants of diamond, whereas those of the smooth fine-grained diamond films are reduced because of the poorer diamond quality leading to lower residual stress in the films.

Key concepts: Materials science, Diamond, Crystallite, Brillouin Spectroscopy, Rayleigh scattering, Chemical vapor deposition, Raman spectroscopy, Brillouin zone

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