2006Unpublished venueRequires access

An Improved Active Load-pull Setup for Transistors Large Signal Characterization in the Ka Band

Ismail Yattoun, Alain Peden

Open publisher page 2 citations

Abstract

This paper presents an original active load-pull test bench for active device characterization in the Ka band. The setup enables measurement and optimization of load conditions for power operation using a modified active load pull technique with pre-matching. The proposed modified active loop with pre-matching offers a larger load reflection coefficient with higher linearity of the loop amplifier. Furthermore, a switch placed between the pre-matching circuit and the loop provides greater automation of the system: calibration, S-parameter and active load-pull measurements with pre-matching or not, can be carried out without dismantling components of the bench. Experimental characterization at 30 GHz of a GaAs PHEMT power transistor is presented as well as the results of the one-stage amplifier that was designed using the transistor load-pull characterization

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What this paper is about

This paper presents an original active load-pull test bench for active device characterization in the Ka band. The setup enables measurement and optimization of load conditions for power operation using a modified active load pull technique with pre-matching. The proposed modified active loop with pre-matching offers a larger load reflection coefficient with higher linearity of the loop amplifier. Furthermore, a switch placed between the pre-matching circuit and the loop provides greater automation of the system: calibration, S-parameter and active load-pull measurements with pre-matching or not, can be carried out without dismantling components of the bench. Experimental characterization at 30 GHz of a GaAs PHEMT power transistor is presented as well as the results of the one-stage amplifier that was designed using the transistor load-pull characterization

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Available abstract

This paper presents an original active load-pull test bench for active device characterization in the Ka band. The setup enables measurement and optimization of load conditions for power operation using a modified active load pull technique with pre-matching. The proposed modified active loop with pre-matching offers a larger load reflection coefficient with higher linearity of the loop amplifier. Furthermore, a switch placed between the pre-matching circuit and the loop provides greater automation of the system: calibration, S-parameter and active load-pull measurements with pre-matching or not, can be carried out without dismantling components of the bench. Experimental characterization at 30 GHz of a GaAs PHEMT power transistor is presented as well as the results of the one-stage amplifier that was designed using the transistor load-pull characterization

Key concepts: Load pull, Active load, Test bench, Amplifier, Transistor, High-electron-mobility transistor, Smith chart, Calibration

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