1992•International Journal of Mass Spectrometry and Ion ProcessesOpen access

Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments

Ulrich Boesl, R. Weinkauf, E. W. Schlag

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Key concepts: Reflectron, Mass spectrometry, Chemistry, Time of flight, Ionization, Laser, Time-of-flight mass spectrometry, Ion source

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Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragments — Research Paper | ScholarLens