1969•Journal of Applied Polymer ScienceRequires access
X‐ray studies on cellophane1
A. Venkateswaran
Open publisher page 4 citations
Abstract
Abstract X‐Ray diffractograms of cellophane showed a considerable variation in the intensity corresponding to the 101, 101, and 002 planes. Applications of generally accepted procedures for estimating crystalline content in cellulosic materials yields varying results for crystallimity in cellophane. It is concluded that such procedures are not applicable to cellophane used in this study.