1991•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Surface defect detection and classification with light scattering

Michael Gebhardt, Horst Truckenbrodt, Bernd Harnisch

Abstract

The quality of smooth technical surfaces is characterized by the surface roughness and by surface defects. For a stable quality control, objective measuring conditions are necessary. The objective measurement of surface defects especially is an unsolved problem. For the investigation of the scattering characteristics of different surface defects, a measuring device was developed. With this measuring device, the type of defect and the angle dependent scattering intensity were measured and compared with theoretical calculations.

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Key concepts: Scattering, Surface (topology), Surface roughness, Materials science, Light scattering, Surface finish, Quality (philosophy), Intensity (physics)