1995IEEE Transactions on Components Packaging and Manufacturing Technology Part ARequires access

Experimental investigation of subcooled liquid nitrogen impingement cooling of a silicon chip

D.T. Vader, G. Chrysler, Richard C. Chu, Robert E. Simons

Open publisher page 29 citations

Abstract

A technique was developed to facilitate subcooled pool boiling and jet impingement boiling of liquid nitrogen at the surface of a silicon chip by varying the dewar pressure while maintaining the bath temperature constant at about 78 K. Subcooling levels of up to 10 K could be easily reached by pressurizing the liquid nitrogen bath with helium gas. Convective and boiling impingement cooling of up to 80 W/cm/sup 3/ from a silicon chip has been measured for a submerged subcooled liquid nitrogen jet.

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What this paper is about

A technique was developed to facilitate subcooled pool boiling and jet impingement boiling of liquid nitrogen at the surface of a silicon chip by varying the dewar pressure while maintaining the bath temperature constant at about 78 K. Subcooling levels of up to 10 K could be easily reached by pressurizing the liquid nitrogen bath with helium gas. Convective and boiling impingement cooling of up to 80 W/cm/sup 3/ from a silicon chip has been measured for a submerged subcooled liquid nitrogen jet.

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Available abstract

A technique was developed to facilitate subcooled pool boiling and jet impingement boiling of liquid nitrogen at the surface of a silicon chip by varying the dewar pressure while maintaining the bath temperature constant at about 78 K. Subcooling levels of up to 10 K could be easily reached by pressurizing the liquid nitrogen bath with helium gas. Convective and boiling impingement cooling of up to 80 W/cm/sup 3/ from a silicon chip has been measured for a submerged subcooled liquid nitrogen jet.

Key concepts: Subcooling, Compressed fluid, Liquid nitrogen, Boiling, Materials science, Silicon, Jet (fluid), Nitrogen

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