2005Annual Conference on ComputersRequires access

TEST: an effective automation tool for testing embedded software

Changhyun Baek, Seung-Kyu Park, Kyunghee Choi

Open publisher page 3 citations

Abstract

Much effort has been made to develop efficient tools for test automation of embedded software. To enhance higher level of test automation, so that errors are detected as early as possible, more comprehensive analytical measures should be taken to embedded systems. This paper presents a framework and implementation of an effective tool for test automation, in which Finite State Machine and Background Logic are adopted for modeling and the tool tests automatically analog and digital embedded systems. The tool aims to be more generic. The integrated tool, called TEST, is implemented to support all aspects occurring from modeling to test case generation. Applying TEST to actual applications shows a significant effectiveness in terms of finding errors and reducing time required to run the test.

About this research paper

What this paper is about

Much effort has been made to develop efficient tools for test automation of embedded software. To enhance higher level of test automation, so that errors are detected as early as possible, more comprehensive analytical measures should be taken to embedded systems. This paper presents a framework and implementation of an effective tool for test automation, in which Finite State Machine and Background Logic are adopted for modeling and the tool tests automatically analog and digital embedded systems. The tool aims to be more generic. The integrated tool, called TEST, is implemented to support all aspects occurring from modeling to test case generation. Applying TEST to actual applications shows a significant effectiveness in terms of finding errors and reducing time required to run the test.

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Available abstract

Much effort has been made to develop efficient tools for test automation of embedded software. To enhance higher level of test automation, so that errors are detected as early as possible, more comprehensive analytical measures should be taken to embedded systems. This paper presents a framework and implementation of an effective tool for test automation, in which Finite State Machine and Background Logic are adopted for modeling and the tool tests automatically analog and digital embedded systems. The tool aims to be more generic. The integrated tool, called TEST, is implemented to support all aspects occurring from modeling to test case generation. Applying TEST to actual applications shows a significant effectiveness in terms of finding errors and reducing time required to run the test.

Key concepts: Automation, Test Management Approach, Computer science, Test harness, Test (biology), System under test, Reliability engineering, Software

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